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DESingle crystal x-ray analysis
Single crystal x-ray analysis, Total:204 items.
In the international standard classification, Single crystal x-ray analysis involves: Education, Testing of metals, Inorganic chemicals, Analytical chemistry, Physics. Chemistry, Semiconducting materials, Optics and optical measurements, Particle size analysis. Sieving, Ferrous metals, Ceramics, Vocabularies, Non-ferrous metals, Air quality, Refractories, Nuclear energy engineering, Construction materials, Non-destructive testing, Radiation measurements, Plastics, Power stations in general, Paint ingredients, Iron and steel products, Products of the chemical industry, Metalliferous minerals, Radiation protection, Production of metals, Electronic tubes, Occupational safety. Industrial hygiene, Medical equipment.
Professional Standard - Education, Single crystal x-ray analysis
- JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
- JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer
- JY/T 0587-2020 General Principles of Polycrystal X-ray Diffraction Methods
- JY/T 009-1996 General Principles of Rotating Target Polycrystal X-ray Derivation Method
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Single crystal x-ray analysis
- GB/T 42676-2023 X-ray Diffraction Method for Testing the Quality of Semiconductor Single Crystal
- GB/T 30904-2014 Inorganic chemicals for industrial use.Crystal form analysis.X-ray diffraction method
- GB/T 32188-2015 Test method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate
- GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer
- GB/T 19140-2003 Technologic rules for X-ray fluorescence analysis of cements
- GB/T 42360-2023 Total Reflection X-ray Fluorescence Spectroscopic Analysis of Water for Surface Chemical Analysis
- GB/T 13710-1992 Blank detail specificationn of X-ary tubes for analysis
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
- GB/T 5225-1985 Metal materials--Quantitative phase analysis--"value K" method of x-ray diffraction
- GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
PT-IPQ, Single crystal x-ray analysis
National Metrological Technical Specifications of the People's Republic of China, Single crystal x-ray analysis
- JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment
Korean Agency for Technology and Standards (KATS), Single crystal x-ray analysis
- KS M 0043-2009 General rules for X-ray diffractometric analysis
- KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
- KS M 0017-2010 General rules for X-ray fluorescence spectrometric analysis
- KS E 3076-2002 Methods for X－ray fluorescence spectrometric analysis of silica stone and silica sand
- KS D 1898-1993 Method for fluorescent X-ray analysis of copper alloys
- KS L 5222-2009 Chemical analysis method of cement by x-ray fluorescence
- KS E 3045-2002(2007) X-ray fluorescence spectrometric analysis for iron ores
- KS D 1654-2021 General rules for X-ray fluorescence spectrometric analysis of iron and steel
- KS L 5222-2019 Chemical analysis method of cement by x-ray fluorescence
- KS D 2710-2019 Methods for X-ray fluorescence spectrometric analysis of ferroniobium
- KS D 1654-1993 General Rules for X-ray Fluorescence Spectrometric Analysis of Iron and Steel
- KS D 1654-2003(2016) General rules for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 1655-1993 Method for X-Ray Fluorescence Spectrometric Analysis of Iron and Steel
- KS D 1898-2019 Copper alloys —Methods for X-ray fluorescence spectrometric analysis
- KS A 4730-2013 Mono-tank X-ray units for diagnostic use
- KS M 0017-2020 General rules for X-ray fluorescence spectrometric analysis
- KS M 0017-1995 General rules for X-ray fluorescence spectrometric analysis
- KS A 4731-1982 MONO-TANK X-RAY UNITS FOR DIAGNOSTIC
- KS D 1655-2019 Method for X-ray fluorescence spectrometric analysis of iron and steel
- KS A 4731-1997 MONO-TANK X-RAY UNITS FOR DIAGNOSTIC
Professional Standard - Aviation, Single crystal x-ray analysis
- HB 6742-1993 Determination of Crystal Orientation of Single Crystal Blades by X-ray Backblow Laue Photography
國(guó)家市場(chǎng)監(jiān)督管理總局、中國(guó)國(guó)家標(biāo)準(zhǔn)化管理委員會(huì), Single crystal x-ray analysis
- GB/T 39123-2020 Specification for cadmium-zinc telluride single crystal material for X-ray and γ-ray detector
- GB/T 36923-2018 Identification of pearl powder―X-ray diffraction analysis
Group Standards of the People's Republic of China, Single crystal x-ray analysis
- T/IAWBS 015-2021 Test method for full width at half maximum of double crystal X-ray rocking curve of Ga2O3 single crystal substrate
- T/IAWBS 016-2022 X-ray double crystal rocking curve FWHM test method for silicon carbide single wafer
- T/IAWBS 017-2022 Test method for full width at half maximum of double crystal X-rayrocking curve of diamond single crystal substrate
Professional Standard - Machinery, Single crystal x-ray analysis
KR-KS, Single crystal x-ray analysis
- KS D ISO 14706-2003(2023) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
- KS D 1655-2008(2019)(英文版) Method for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 1655-2008(2024) Method for X-ray fluorescence spectrometric analysis of iron and steel
British Standards Institution (BSI), Single crystal x-ray analysis
- BS ISO 17867:2015 Particle size analysis. Small-angle X-ray scattering
- BS ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
- BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS)
- DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
- 20/30360821 DC BS ISO 22278. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
- BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
- BS DD ISO/TS 13762:2002 Particle size analysis - Small angle X-ray scattering method
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
- BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
- BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
- BS EN 13925-1:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
- 24/30482073 DC BS ISO 20289 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
- BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- 23/30442725 DC Draft BS ISO 5861. Surface chemical analysis. X-ray photoelectron spectroscopy. Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
GSO, Single crystal x-ray analysis
- OS GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
- GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
- BH GSO ISO 16258-2:2022 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 2: Method by indirect analysis
- GSO ISO 16258-2:2021 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 2: Method by indirect analysis
- BH GSO IEC 62495:2016 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- OS GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- NB/SH/T 6058-2022 Determination of relative crystallinity of ZSM-22 molecular sieve by X-ray diffraction method
- NB/SH/T 0972-2018 Determination of unit cell parameters of SAPO-11 molecular sieve by powder X-ray diffraction method
- GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
- BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
- OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
- BH GSO ISO 16258-1:2022 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 1: Direct-on-filter method
- GSO ISO 16258-1:2021 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 1: Direct-on-filter method
- NB/SH/T 0971-2018 Determination of relative crystallinity of SAPO-11 molecular sieve by powder X-ray diffraction method
International Organization for Standardization (ISO), Single crystal x-ray analysis
- ISO 17867:2015 Particle size analysis - Small-angle X-ray scattering
- ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
- ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
- ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
- ISO 17867:2020 Particle size analysis — Small angle X-ray scattering (SAXS)
- ISO/PRF 5861:2024 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
- ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
- ISO/TS 13762:2001 Particle size analysis - Small angle X-ray scattering method
- ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 2: Method by indirect analysis
- ISO/TS 23361:2024 Nanotechnologies — Crystallinity of cellulose nanomaterials by powder X-ray diffraction (Rietveld analysis)
- ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
- ISO 14706:2014 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- ISO 16258-1:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 1: Direct-on-filter method
- ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
RU-GOST R, Single crystal x-ray analysis
Standard Association of Australia （SAA）, Single crystal x-ray analysis
- ISO 5861:2024 Surface chemical analysis - X-ray photoelectron spectroscopy - Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
- AS 1932D:1976 Sizes of film for industrial radiography and x-ray crystallography
National Metrological Verification Regulations of the People's Republic of China, Single crystal x-ray analysis
German Institute for Standardization, Single crystal x-ray analysis
- DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
- DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN 51418-1:2008-08 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
- DIN EN 13925-2:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
- DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN 6836:1963 X-ray tubes and single tank X-ray generators; holders for X-ray application tables and stands, dimensions for assembling
- DIN EN 13925-1:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
- DIN 51418-2:2015-03 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
SCC, Single crystal x-ray analysis
- BS ISO 5861:2024 Surface chemical analysis. X-ray photoelectron spectroscopy. Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
- BS DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
- DANSK DS/ISO 17867:2020 Particle size analysis – Small angle X-ray scattering (SAXS)
- DIN 51418-1 E:2007 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DANSK DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
- DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- NS-EN 13925-2:2003 Non-destructive testing — X-ray diffraction from polycrystalline and amorphous materials — Part 2: Procedures
- NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
- AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- AENOR UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
- NS-EN 13925-1:2003 Non-destructive testing — X-ray diffraction from polycrystalline and amorphous material — Part 1: General principles
- DANSK DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
- AENOR UNE-EN 13925-2:2004 Non destructive essays. X-ray diffraction applied to polycrystalline and amorphous materials. Part 2: Procedures
- DIN 51418-2 E:2014 Draft Document - X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
工業(yè)和信息化部, Single crystal x-ray analysis
- YS/T 1178-2017 Aluminum slag phase analysis X-ray diffraction method
- YB/T 172-2020 Quantitative phase analysis of silica bricks by X-ray diffraction method
- SH/T 1827-2019 Determination of crystallinity of plastics by X-ray diffraction method
- YS/T 1344.3-2020 Chemical analysis method of tin-doped indium oxide powder Part 3: Phase analysis X-ray diffraction analysis method
中華人民共和國(guó)國(guó)家質(zhì)量監(jiān)督檢驗(yàn)檢疫總局、中國(guó)國(guó)家標(biāo)準(zhǔn)化管理委員會(huì), Single crystal x-ray analysis
- GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals
- GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
Association Francaise de Normalisation, Single crystal x-ray analysis
- NF X43-600-2*NF ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by x-ray diffraction - Part 2 : method by indirect analysis
- NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
- NF A09-280-2*NF EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous materials - Part 2 : procedures
- NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11: X-ray diffraction of polycrystalline and amorphous materials
- NF A09-280-1*NF EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1 : general principles.
- NF EN 13925-2:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 2 : procédures
- NF EN 13925-3:2005 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 3 : appareillage
- NF EN 13925-1:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 1 : principes généraux
- NF X43-600-1*NF ISO 16258-1:2015 Workplace Air - Analysis of respirable crystalline silica by X-ray diffraction - Part 1: direct-on-filter method
American Society for Testing and Materials (ASTM), Single crystal x-ray analysis
- ASTM F847-94(1999) Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
- ASTM E1621-21 Standard Guide for X-Ray Emission Spectrometric Analysis
- ASTM D5380-93(2009) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
- ASTM D5380-93(2014) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
- ASTM D5380-93(2021) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
- ASTM D5380-93(2003) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
- ASTM D5380-93(1998) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
- ASTM E1621-05 Standard Guide for X-Ray Emission Spectrometric Analysis
未注明發(fā)布機(jī)構(gòu), Single crystal x-ray analysis
- JIS Z 8891:2023 Particle size analysis -- Small angle X-ray scattering (SAXS)
Professional Standard - Ferrous Metallurgy, Single crystal x-ray analysis
- YB/T 172-2000 Phase quantitative analysis of silica bricks.X-ray diffraction method
- YB/T 4177-2008 Determination of chemical composition in stag by X-ray fluorescence spectrometry
- YB/T 5320-2006 X-ray Diffraction K Value Method for Quantitative Phase Analysis of Metallic Materials
Japanese Industrial Standards Committee (JISC), Single crystal x-ray analysis
- JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
- JIS G 1256:1982 Fluorescence X-ray analysis method of steel
- JIS K 0131:1996 General rules for X-ray diffractometric analysis
- JIS M 8205:1983 X-ray fluorescence spectrometric analysis for iron ores
- JIS H 1292:2018 Copper alloys -- Methods for X-ray fluorescence spectrometric analysis
- JIS G 1256:1997 Iron and steel -- Method for X-ray fluorescence spectrometric analysis
- JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
- JIS H 1292:2005 Methods for X-ray fluorescence spectrometric analysis of copper alloys
- JIS R 2216:2005 Methods for X-ray fluorescence spectrometric analysis of refractory products
- JIS K 0148:2005 Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Professional Standard - Nuclear Industry, Single crystal x-ray analysis
- EJ/T 1068-1998 Plutonium-238 sources fluorescence analysis for x-ray
- EJ/T 1067-1998 Americium-241 sources fluorescence analysis for X-ray
- EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
- EJ/T 805-1993 Low Energy Photon Sources for X-ray Fluorescence Analysis
- EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method
- EJ/T 684-1992 Portable source excited X-ray fluorescence analyzer
Professional Standard - Building Materials, Single crystal x-ray analysis
Danish Standards Foundation, Single crystal x-ray analysis
- DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
- DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
Lithuanian Standards Office , Single crystal x-ray analysis
- LST EN 13925-2-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
- LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- LST EN 13925-1-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
Spanish Association for Standardization (UNE), Single crystal x-ray analysis
- UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- UNE-EN 13925-2:2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
- UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
European Committee for Standardization (CEN), Single crystal x-ray analysis
- EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
Professional Standard - Electricity, Single crystal x-ray analysis
- DL/T 1151.22-2012 Analytical methods of scale and corrosion products in power plants.Part 22: standard test methods of X-ray fluorescence spectrometry and X-ray diffraction
Professional Standard - Energy, Single crystal x-ray analysis
- NB/SH/T 6033-2021 Determination of unit cell parameters of ZSM-22 molecular sieve X-ray diffraction method
- NB/SH/T 6015-2020 Determination of Unit Cell Parameters of ZSM-23 Molecular Sieve by X-ray Diffraction Method
- NB/SH/T 6024-2021 Determination of Relative Crystallinity of ZSM-5 Molecular Sieve X-ray Diffraction Method
- NB/SH/T 0339-2021 Determination of Unit Cell Parameters of Faujasite Molecular Sieve X-ray Diffraction Method
American National Standards Institute （ANSI), Single crystal x-ray analysis
- ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
Professional Standard - Electron, Single crystal x-ray analysis
- SJ 20719-1998 Method of determination X value for mercury cadmium telluride for use in X-ray fluorimetry
International Electrotechnical Commission (IEC), Single crystal x-ray analysis
- IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
Occupational Health Standard of the People's Republic of China, Single crystal x-ray analysis
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
Taiwan Provincial Standard of the People's Republic of China, Single crystal x-ray analysis
- CNS 11942.23-2000 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
- CNS 11942-23-2000 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
VDE - VDE Verlag GmbH@ Berlin@ Germany, Single crystal x-ray analysis
- VDE 0412-20-2011 Strahlungsmessgeraete - Tragbare Roentgenfluoreszenz-Analysegeraete mit Kleinstroentgenroehre (IEC 62495:2011)
CZ-CSN, Single crystal x-ray analysis