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DESingle crystal x-ray diffractometer analysis
Single crystal x-ray diffractometer analysis, Total:96 items.
In the international standard classification, Single crystal x-ray diffractometer analysis involves: Education, Optics and optical measurements, Analytical chemistry, Radiation protection, Testing of metals, Non-destructive testing, Inorganic chemicals, Occupational safety. Industrial hygiene, Products of the chemical industry, Production of metals, Non-ferrous metals, Refractories, Plastics, Non-metalliferous minerals, Construction materials, Radiation measurements, Ceramics, Power stations in general, Air quality.
National Metrological Verification Regulations of the People's Republic of China, Single crystal x-ray diffractometer analysis
PT-IPQ, Single crystal x-ray diffractometer analysis
Professional Standard - Education, Single crystal x-ray diffractometer analysis
- JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
- JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer
- JY/T 0587-2020 General Principles of Polycrystal X-ray Diffraction Methods
- JY/T 009-1996 General Principles of Rotating Target Polycrystal X-ray Derivation Method
Professional Standard - Machinery, Single crystal x-ray diffractometer analysis
Korean Agency for Technology and Standards (KATS), Single crystal x-ray diffractometer analysis
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Single crystal x-ray diffractometer analysis
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 42676-2023 X-ray Diffraction Method for Testing the Quality of Semiconductor Single Crystal
- GB/T 30904-2014 Inorganic chemicals for industrial use.Crystal form analysis.X-ray diffraction method
- GB/T 8359-1987 Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometer
- GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer
- GB/T 5225-1985 Metal materials--Quantitative phase analysis--"value K" method of x-ray diffraction
British Standards Institution (BSI), Single crystal x-ray diffractometer analysis
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
- BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
- BS EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
- BS EN 13925-1:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
- BS ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
Occupational Health Standard of the People's Republic of China, Single crystal x-ray diffractometer analysis
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
SCC, Single crystal x-ray diffractometer analysis
- DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
- DANSK DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
- NS-EN 13925-2:2003 Non-destructive testing — X-ray diffraction from polycrystalline and amorphous materials — Part 2: Procedures
- NS-EN 13925-1:2003 Non-destructive testing — X-ray diffraction from polycrystalline and amorphous material — Part 1: General principles
- AENOR UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
- DANSK DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
- DANSK DS/EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
European Committee for Standardization (CEN), Single crystal x-ray diffractometer analysis
- EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
AENOR, Single crystal x-ray diffractometer analysis
- UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- UNE-EN 13925-2:2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
- UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
German Institute for Standardization, Single crystal x-ray diffractometer analysis
- DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
- DIN EN 13925-2:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
- DIN EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
- DIN EN 13925-1:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
- DIN EN 15305 Berichtigung 1:2009-04 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
- DIN EN 15305:2009-01 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
Association Francaise de Normalisation, Single crystal x-ray diffractometer analysis
- NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
- NF A09-280-2*NF EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous materials - Part 2 : procedures
- NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11: X-ray diffraction of polycrystalline and amorphous materials
- NF EN 13925-2:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 2 : procédures
- NF A09-280-1*NF EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1 : general principles.
- NF X43-600-2*NF ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by x-ray diffraction - Part 2 : method by indirect analysis
- NF EN 15305:2009 Essais non-destructifs - Méthode d'essai pour l'analyse des contraintes résiduelles par diffraction des rayons X
Japanese Industrial Standards Committee (JISC), Single crystal x-ray diffractometer analysis
- JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry
- JIS K 0131:1996 General rules for X-ray diffractometric analysis
Danish Standards Foundation, Single crystal x-ray diffractometer analysis
- DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
- DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
國家市場監(jiān)督管理總局、中國國家標(biāo)準(zhǔn)化管理委員會(huì), Single crystal x-ray diffractometer analysis
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
- GB/T 36923-2018 Identification of pearl powder―X-ray diffraction analysis
- GB/T 40407-2021 X-ray powder diffraction analysis method for determining the phases in portland cement clinker
Lithuanian Standards Office , Single crystal x-ray diffractometer analysis
- LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- LST EN 13925-2-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
- LST EN 13925-1-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
工業(yè)和信息化部, Single crystal x-ray diffractometer analysis
- YS/T 1178-2017 Aluminum slag phase analysis X-ray diffraction method
- YB/T 172-2020 Quantitative phase analysis of silica bricks by X-ray diffraction method
- SH/T 1827-2019 Determination of crystallinity of plastics by X-ray diffraction method
- YB/T 5338-2019 X-ray diffractometer method for quantitative determination of austenite in steel
Professional Standard - Ferrous Metallurgy, Single crystal x-ray diffractometer analysis
- YB/T 5336-2006 Quantitative Analysis of Carbide Phase in High Speed Steel by X-ray Diffraction Method
- YB/T 172-2000 Phase quantitative analysis of silica bricks.X-ray diffraction method
- YB/T 5320-2006 X-ray Diffraction K Value Method for Quantitative Phase Analysis of Metallic Materials
National Metrological Technical Specifications of the People's Republic of China, Single crystal x-ray diffractometer analysis
- JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment
American National Standards Institute （ANSI), Single crystal x-ray diffractometer analysis
- ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
中華人民共和國國家質(zhì)量監(jiān)督檢驗(yàn)檢疫總局、中國國家標(biāo)準(zhǔn)化管理委員會(huì), Single crystal x-ray diffractometer analysis
- GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals
Professional Standard - Customs, Single crystal x-ray diffractometer analysis
- HS/T 12-2006 Quantitative analysis of talc, chlorite, magnesite mixed phase.Method of X-ray diffractometer
Professional Standard - Energy, Single crystal x-ray diffractometer analysis
- NB/SH/T 6033-2021 Determination of unit cell parameters of ZSM-22 molecular sieve X-ray diffraction method
- NB/SH/T 6015-2020 Determination of Unit Cell Parameters of ZSM-23 Molecular Sieve by X-ray Diffraction Method
- NB/SH/T 6024-2021 Determination of Relative Crystallinity of ZSM-5 Molecular Sieve X-ray Diffraction Method
- NB/SH/T 0339-2021 Determination of Unit Cell Parameters of Faujasite Molecular Sieve X-ray Diffraction Method
Professional Standard - Agriculture, Single crystal x-ray diffractometer analysis
Professional Standard - Nuclear Industry, Single crystal x-ray diffractometer analysis
- EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method
- EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
GSO, Single crystal x-ray diffractometer analysis
- NB/SH/T 6058-2022 Determination of relative crystallinity of ZSM-22 molecular sieve by X-ray diffraction method
- NB/SH/T 0972-2018 Determination of unit cell parameters of SAPO-11 molecular sieve by powder X-ray diffraction method
- NB/SH/T 0971-2018 Determination of relative crystallinity of SAPO-11 molecular sieve by powder X-ray diffraction method
- BH GSO ISO 16258-2:2022 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 2: Method by indirect analysis
- GSO ISO 16258-2:2021 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 2: Method by indirect analysis
International Organization for Standardization (ISO), Single crystal x-ray diffractometer analysis
- ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
Professional Standard - Electricity, Single crystal x-ray diffractometer analysis
- DL/T 1151.22-2012 Analytical methods of scale and corrosion products in power plants.Part 22: standard test methods of X-ray fluorescence spectrometry and X-ray diffraction
KR-KS, Single crystal x-ray diffractometer analysis
- KS D ISO 14706-2003(2023) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
Professional Standard - Building Materials, Single crystal x-ray diffractometer analysis