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X-ray single crystal diffractometer

X-ray single crystal diffractometer, Total:59 items.

In the international standard classification, X-ray single crystal diffractometer involves: Optics and optical measurements, Non-destructive testing, Testing of metals, Products of the chemical industry, Production of metals, Analytical chemistry, Education, Plastics, Radiation protection, Inorganic chemicals, Ceramics, Occupational safety. Industrial hygiene.

National Metrological Verification Regulations of the People's Republic of China, X-ray single crystal diffractometer

• JJG 629-1989 Verification Regulation for Polycrystalline X-Ray Diffractometer
• JJG(地質(zhì)) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
• JJG 629-2014 Polycrystalline X-Ray Diffractometers

Professional Standard - Machinery, X-ray single crystal diffractometer

• JB/T 11144-2011 X-ray diffractometer
• JB/T 9400-2010 Specification of X-ray diffractometer
• JB/T 9400-1999 Specification for X-ray diffractometer
• JB/T 5482-2011 X-ray orientation apparatus

British Standards Institution (BSI), X-ray single crystal diffractometer

• BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
• BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
• BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
• BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
• BS EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
• BS EN 13925-1:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
• BS ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, X-ray single crystal diffractometer

• GB/T 42676-2023 X-ray Diffraction Method for Testing the Quality of Semiconductor Single Crystal
• GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
• GB/T 30904-2014 Inorganic chemicals for industrial use.Crystal form analysis.X-ray diffraction method

Japanese Industrial Standards Committee (JISC), X-ray single crystal diffractometer

• JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry

國家市場監(jiān)督管理總局、中國國家標準化管理委員會, X-ray single crystal diffractometer

• GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation

Professional Standard - Education, X-ray single crystal diffractometer

• JY/T 0587-2020 General Principles of Polycrystal X-ray Diffraction Methods
• JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
• JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer
• JY/T 009-1996 General Principles of Rotating Target Polycrystal X-ray Derivation Method

Danish Standards Foundation, X-ray single crystal diffractometer

• DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
• DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures

Spanish Association for Standardization (UNE), X-ray single crystal diffractometer

• UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
• UNE-EN 13925-2:2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures

Association Francaise de Normalisation, X-ray single crystal diffractometer

• NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
• NF A09-280-2*NF EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous materials - Part 2 : procedures
• NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11: X-ray diffraction of polycrystalline and amorphous materials

German Institute for Standardization, X-ray single crystal diffractometer

• DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
• DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
• DIN EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
• DIN EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
• DIN EN 13925-2:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003

European Committee for Standardization (CEN), X-ray single crystal diffractometer

• EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
• EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures

SCC, X-ray single crystal diffractometer

• DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
• NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
• AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
• DANSK DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
• NS-EN 13925-2:2003 Non-destructive testing — X-ray diffraction from polycrystalline and amorphous materials — Part 2: Procedures

Lithuanian Standards Office , X-ray single crystal diffractometer

• LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
• LST EN 13925-2-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures

工業(yè)和信息化部, X-ray single crystal diffractometer

• SH/T 1827-2019 Determination of crystallinity of plastics by X-ray diffraction method
• YB/T 5338-2019 X-ray diffractometer method for quantitative determination of austenite in steel

National Metrological Technical Specifications of the People's Republic of China, X-ray single crystal diffractometer

• JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment

中華人民共和國國家質(zhì)量監(jiān)督檢驗檢疫總局、中國國家標準化管理委員會, X-ray single crystal diffractometer

• GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals

Professional Standard - Agriculture, X-ray single crystal diffractometer

• 57藥典 四部-2020 0451 X-ray diffraction method
• 77藥典 四部-2015 0451 X-ray diffraction method

PT-IPQ, X-ray single crystal diffractometer

• E E 14-1971 X-ray diffraction analysis

Professional Standard - Nuclear Industry, X-ray single crystal diffractometer

• EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method

Korean Agency for Technology and Standards (KATS), X-ray single crystal diffractometer

• KS M 0043-2009 General rules for X-ray diffractometric analysis

Professional Standard - Energy, X-ray single crystal diffractometer

• NB/SH/T 6033-2021 Determination of unit cell parameters of ZSM-22 molecular sieve X-ray diffraction method
• NB/SH/T 6015-2020 Determination of Unit Cell Parameters of ZSM-23 Molecular Sieve by X-ray Diffraction Method
• NB/SH/T 6024-2021 Determination of Relative Crystallinity of ZSM-5 Molecular Sieve X-ray Diffraction Method

International Organization for Standardization (ISO), X-ray single crystal diffractometer

• ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam

Occupational Health Standard of the People's Republic of China, X-ray single crystal diffractometer

• GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment

GSO, X-ray single crystal diffractometer

• NB/SH/T 6058-2022 Determination of relative crystallinity of ZSM-22 molecular sieve by X-ray diffraction method

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