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DEX-ray Spectrometer Energy Spectrometer
X-ray Spectrometer Energy Spectrometer, Total:97 items.
In the international standard classification, X-ray Spectrometer Energy Spectrometer involves: Optics and optical measurements, Analytical chemistry, Linear and angular measurements, Radiation measurements, Metalliferous minerals, Nuclear energy engineering, Metrology and measurement in general, Electricity. Magnetism. Electrical and magnetic measurements, Testing of metals, Non-destructive testing, Surface treatment and coating.
Professional Standard - Machinery, X-ray Spectrometer Energy Spectrometer
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, X-ray Spectrometer Energy Spectrometer
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
- GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
- GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
- GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
- GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
- GB/T 28892-2024 Surface chemical analysis X-ray photoelectron spectroscopy Expression of selected instrument performance parameters
- GB/Z 42358-2023 Determination of Accuracy of Wavelength Dispersive X-ray Fluorescence Spectrometer for Iron Ore
SE-SIS, X-ray Spectrometer Energy Spectrometer
- SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
Korean Agency for Technology and Standards (KATS), X-ray Spectrometer Energy Spectrometer
- KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
- KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
- KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
- KS C IEC 60759-2019 Standard test procedures for semiconductor X-ray energy spectrometers
- KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
- KS D ISO 21270-2020 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
- KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
- KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
- KS D ISO 15470-2020 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
- KS C IEC 61452-2022 Nuclear instrumentation — Measurement of gamma-ray emission rates of radionuclides — Calibration and use of germanium spectrometers
- KS C IEC 61452:2017 Nuclear instrumentation — Measurement of gamma-ray emission rates of radionuclides — Calibration and use of germanium spectrometers
- KS D ISO 3497-2002(2017) Metallic coatings－Measurement of coating thickness－X-ray spectrometric methods
International Organization for Standardization (ISO), X-ray Spectrometer Energy Spectrometer
- ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO/TR 18231:2016 Iron ores - Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
German Institute for Standardization, X-ray Spectrometer Energy Spectrometer
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
- DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
- DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
British Standards Institution (BSI), X-ray Spectrometer Energy Spectrometer
- BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
- BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
- PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
GSO, X-ray Spectrometer Energy Spectrometer
- OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- OS GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
- GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
- BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
- GSO ISO/TR 18231:2021 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
- BH GSO ISO/TR 18231:2022 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
International Electrotechnical Commission (IEC), X-ray Spectrometer Energy Spectrometer
- IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
- IEC 60759:1983/AMD1:1991 Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1
National Metrological Technical Specifications of the People's Republic of China, X-ray Spectrometer Energy Spectrometer
- JJF 2024-2023 Calibration specifications for energy dispersive X-ray fluorescence spectrometers
- JJF 2067-2023 Calibration Specification for Energy-Dispersive X-ray Spectrometers
- JJF 1850-2020 Calibration Specification for Germanium Gamma-ray Spectrometers
- JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
CZ-CSN, X-ray Spectrometer Energy Spectrometer
工業(yè)和信息化部/國(guó)家能源局, X-ray Spectrometer Energy Spectrometer
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
- JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer
- JB/T 12962.1-2016 Energy-dispersive X-ray fluorescence spectrometers Part 1: General techniques
未注明發(fā)布機(jī)構(gòu), X-ray Spectrometer Energy Spectrometer
- DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- AS 2563:1996(R2016) Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
Institute of Electrical and Electronics Engineers (IEEE), X-ray Spectrometer Energy Spectrometer
Japanese Industrial Standards Committee (JISC), X-ray Spectrometer Energy Spectrometer
SCC, X-ray Spectrometer Energy Spectrometer
- 11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- CEI 45-35:1997 Standardized test methods of semiconductor X-ray spectrometers
- BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
- BS ISO 15632:2002 Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
- DIN ISO 16129 E:2020 Draft Document - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- AS 2563:1982 Wavelength dispersive X-ray fluorescence spectrometers - Methods of test for determination of precision
IN-BIS, X-ray Spectrometer Energy Spectrometer
- IS 12737-1988 Standard test procedures for semiconductor X-ray energy spectrometers
- IS 12803-1989 Method for analyzing hydraulic cement using X-ray fluorescence spectrometer
National Metrological Verification Regulations of the People's Republic of China, X-ray Spectrometer Energy Spectrometer
Group Standards of the People's Republic of China, X-ray Spectrometer Energy Spectrometer
- T/CSTM 00901-2023 Calibration specification for handheld X-ray fluorescence spectrometer
Professional Standard - Electron, X-ray Spectrometer Energy Spectrometer
- SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers
Association Francaise de Normalisation, X-ray Spectrometer Energy Spectrometer
- NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
Standard Association of Australia （SAA）, X-ray Spectrometer Energy Spectrometer
- AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- AS 2563:2019 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
中華人民共和國(guó)國(guó)家質(zhì)量監(jiān)督檢驗(yàn)檢疫總局、中國(guó)國(guó)家標(biāo)準(zhǔn)化管理委員會(huì), X-ray Spectrometer Energy Spectrometer
- GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
RU-GOST R, X-ray Spectrometer Energy Spectrometer
- GOST 22091.8-1984 X-ray devices. Method of measuring spectral structure and relative spectrum contamination
American Society for Testing and Materials (ASTM), X-ray Spectrometer Energy Spectrometer
- ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
- ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
- ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
KR-KS, X-ray Spectrometer Energy Spectrometer
Professional Standard - Agriculture, X-ray Spectrometer Energy Spectrometer
- JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer
Professional Standard - Nuclear Industry, X-ray Spectrometer Energy Spectrometer
- EJ/T 584-1994 Portable gamma radiation instrument and gamma energy spectrometer for exploration