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DEx-ray photoelectron spectroscopy and x-ray x
x-ray photoelectron spectroscopy and x-ray x, Total:314 items.
In the international standard classification, x-ray photoelectron spectroscopy and x-ray x involves: Analytical chemistry, Optics and optical measurements, Vocabularies, Nuclear energy engineering, Power stations in general, Ferrous metals, Non-destructive testing, Iron and steel products, Construction materials, Metalliferous minerals, Testing of metals, Linear and angular measurements, Non-ferrous metals, Refractories, Optical equipment, Ferroalloys, Paint ingredients, Semiconducting materials, Medical sciences and health care facilities in general, Radiation measurements, Radiation protection, Electronic components in general, Particle size analysis. Sieving, Mining equipment, Electricity. Magnetism. Electrical and magnetic measurements, Occupational safety. Industrial hygiene, Electronic tubes, Astronomy. Geodesy. Geography, Medical equipment, Protection against crime, Non-metalliferous minerals.
German Institute for Standardization, x-ray photoelectron spectroscopy and x-ray x
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-1:2008-08 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- DIN 51418-2:2015-03 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
- DIN 51418-2 E:2014-06 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
- DIN 51418-2 Bb.1:2000 X-ray spectrometry - X-Ray Emission- and X-ray Fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results; additional information and examples of calculation
- DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
- DIN 6836:1963 X-ray tubes and single tank X-ray generators; holders for X-ray application tables and stands, dimensions for assembling
British Standards Institution (BSI), x-ray photoelectron spectroscopy and x-ray x
- BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
- BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
- BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
- BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
- BS ISO 14701:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
- BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
- BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
- BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
- BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- BS ISO 17867:2015 Particle size analysis. Small-angle X-ray scattering
- BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
- BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS)
- DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
- BS ISO 19318:2021 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
- BS ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
International Organization for Standardization (ISO), x-ray photoelectron spectroscopy and x-ray x
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
- ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
- ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
- ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
- ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
- ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
- ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
- ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
- ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
- ISO 17867:2015 Particle size analysis - Small-angle X-ray scattering
- ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
- ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
GSO, x-ray photoelectron spectroscopy and x-ray x
- BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
- BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
- OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
- GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- OS GSO ISO 18554:2017 Surface chemical analysis -- Electron spectroscopies -- Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
- GSO ISO 18554:2017 Surface chemical analysis -- Electron spectroscopies -- Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
- OS GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
- BH GSO ISO 13424:2017 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
- GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
- GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- GSO ISO 14701:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Measurement of silicon oxide thickness
- GSO ISO 15472:2013 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- GSO ISO/TR 18392:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for determining backgrounds
- OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- DL/T 1151.22-2023 Analysis methods for scale and corrosion products in thermal power plants Part 22: Wavelength dispersive X-ray fluorescence spectrometry and X-ray diffraction
- BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- OS GSO ISO 16243:2015 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- GSO ISO 16243:2015 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- BH GSO ISO 16243:2017 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- GSO ISO 15470:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
- BH GSO IEC 62495:2016 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- OS GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- GSO ISO 24237:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Repeatability and constancy of intensity scale
- OS GSO ISO 19318:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of methods used for charge control and charge correction
- BH GSO ISO 19318:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of methods used for charge control and charge correction
- OS GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
- GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
- BH GSO ISO 17470:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, x-ray photoelectron spectroscopy and x-ray x
- GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
- GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
- GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
- GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
- GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
- GB/T 28632-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 42360-2023 Total Reflection X-ray Fluorescence Spectroscopic Analysis of Water for Surface Chemical Analysis
- GB/T 19140-2003 Technologic rules for X-ray fluorescence analysis of cements
- GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
- GB/T 28892-2024 Surface chemical analysis X-ray photoelectron spectroscopy Expression of selected instrument performance parameters
- GB/T 28633-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
- GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
- GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
- GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
- GB/T 17362-2008 Scanning electron microscope X-ray energy spectrum analysis method for gold products
- GB/T 16597-1996 Analytical methods of metallurgical products. General rule for X-ray fluorescence spectrometric methods
- GB/T 25185-2010 Surface chemical analysis.X-ray photoelectron spectroscopy.Reporting of methods used for charge control and charge correction
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
- GB/T 12079-1989 Measurements of the photoelectric properties for X-ray tubes
- GB/T 12079-2012 Measurements of the photoelectric properties for X-ray tubes
- GB/Z 42520-2023 Guidelines for X-ray fluorescence spectrometric laboratory practice for the analysis of iron ores
- GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
SCC, x-ray photoelectron spectroscopy and x-ray x
- 11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- DIN 51418-1 E:2007 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN ISO 16129 E:2020 Draft Document - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- 09/30191895 DC BS ISO 10810. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- DIN 51418-2 E:2014 Draft Document - X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
- ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
- BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- 10/30212265 DC BS ISO 14701. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
- 10/30199175 DC BS ISO 16243. Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- SPC GB/T 16597-2019 Analytical methods of metallurgical products -- General rule for X-ray fluorescence spectrometric methods (TEXT OF DOCUMENT IS IN CHINESE)
- BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
- BS ISO 17470:2004 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- VDI/VDE 5575 BLATT 4:2018 X-ray optical systems — X-ray mirrors and X-ray mirror systems — Total reflection and multilayer mirrors
- VDI/VDE 5575 BLATT 7-2019 X-ray optical systems - Refractive X-ray lenses
- DANSK DS/ISO 17867:2020 Particle size analysis – Small angle X-ray scattering (SAXS)
- BS DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
- AWWA 51768 Identification of Low Pressure Reverse Osmosis Membrane Failure by X-Ray Photoelectron Spectroscopy
- VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
- BS ISO 19318:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Professional Standard - Nuclear Industry, x-ray photoelectron spectroscopy and x-ray x
- EJ/T 805-1993 Low Energy Photon Sources for X-ray Fluorescence Analysis
- EJ/T 1068-1998 Plutonium-238 sources fluorescence analysis for x-ray
- EJ/T 1067-1998 Americium-241 sources fluorescence analysis for X-ray
- EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
- EJ/T 684-2016 Portable Energy Dispersive X-ray Fluorescence Analyzer
Association Francaise de Normalisation, x-ray photoelectron spectroscopy and x-ray x
- NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
- NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
- NF ISO 16243:2012 Chemical Analysis of Surfaces - X-ray Photoelectron Spectroscopy (XPS) Data Logging and Reporting
- NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
- NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
American Society for Testing and Materials (ASTM), x-ray photoelectron spectroscopy and x-ray x
- ASTM E1621-21 Standard Guide for X-Ray Emission Spectrometric Analysis
- ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E1621-05 Standard Guide for X-Ray Emission Spectrometric Analysis
- ASTM D5381-93(2003) Standard Guide for X-Ray Fluorescence (XRF) Spectroscopy of Pigments and Extenders
- ASTM D5381-93(1998) Standard Guide for X-Ray Fluorescence (XRF) Spectroscopy of Pigments and Extenders
- ASTM E1085-95(2000) Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
- ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM E1085-95(2004) Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
- ASTM E1085-95(2004)e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
- ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
- ASTM E322-96e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels and Cast Irons
- ASTM E572-02a(2006) Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
- ASTM E572-02a Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
- ASTM E1361-90(1999) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
- ASTM E572-02a(2006)e1 Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
- ASTM E572-94(2000) Standard Test Method for X-Ray Emission Spectrometric Analysis of Stainless Steel
- ASTM E1361-02(2021) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
- ASTM E572-94(2000)e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Stainless Steel
- ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
- ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM C1271-99(2006) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
- ASTM E2735-14(2020) Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
- ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
- ASTM F3094-14(2022) Standard Test Method for Determining Protection Provided By X-ray Shielding Garments Used in Medical X-ray Fluoroscopy from Sources of Scattered X-Rays
Professional Standard - Electricity, x-ray photoelectron spectroscopy and x-ray x
- DL/T 1151.22-2012 Analytical methods of scale and corrosion products in power plants.Part 22: standard test methods of X-ray fluorescence spectrometry and X-ray diffraction
Japanese Industrial Standards Committee (JISC), x-ray photoelectron spectroscopy and x-ray x
- JIS G 1256:1997 Iron and steel -- Method for X-ray fluorescence spectrometric analysis
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
- JIS R 2216:2005 Methods for X-ray fluorescence spectrometric analysis of refractory products
- JIS H 1292:1997 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
- JIS H 1287:2015 Nickel and nickel alloys -- Methods for X-ray fluorescence spectrometric analysis
- JIS G 1256 AMD 1:2010 Iron and steel -- Method for X-ray fluorescence spectrometric analysis (Amendment 1)
- JIS G 1351:2006 Ferroalloys -- Method of X-ray fluorescence spectrometric analysis
- JIS H 1631:2008 Titanium alloys -- Method for X-ray fluorescence spectrometric analysis
- JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
- JIS G 1256 AMD 2:2013 Iron and steel.Method for X-ray fluorescence spectrometric analysis (Amendment 2)
- JIS G 1351:1987 Method for X-ray fluorescence spectrometric analysis of ferroalloys
- JIS H 1669:1990 Method for X-ray fluorescence spectrometric analysis of zirconium alloys
- JIS H 1292:2018 Copper alloys -- Methods for X-ray fluorescence spectrometric analysis
- JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- JIS G 1256:1982 Fluorescence X-ray analysis method of steel
- JIS R 2216:1995 Method for X-ray fluorescence spectrometric analysis of refractory bricks and refractory mortars
- JIS M 8205:1983 X-ray fluorescence spectrometric analysis for iron ores
- JIS K 0119:1997 General rules for X-ray fluorescence spectrometric analysis
- JIS K 0119:2008 General rules for X-ray fluorescence analysis
- JIS H 1292:2005 Methods for X-ray fluorescence spectrometric analysis of copper alloys
- JIS Z 4102:1994 X-ray tube for medical use
- JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
KR-KS, x-ray photoelectron spectroscopy and x-ray x
Korean Agency for Technology and Standards (KATS), x-ray photoelectron spectroscopy and x-ray x
- KS D 1654-2021 General rules for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 1654-2003(2016) General rules for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 2710-2019 Methods for X-ray fluorescence spectrometric analysis of ferroniobium
- KS D 1654-1993 General Rules for X-ray Fluorescence Spectrometric Analysis of Iron and Steel
- KS D ISO 21270-2020 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
- KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
- KS D 1655-1993 Method for X-Ray Fluorescence Spectrometric Analysis of Iron and Steel
- KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
- KS D 1898-2019 Copper alloys —Methods for X-ray fluorescence spectrometric analysis
- KS M 0017-2020 General rules for X-ray fluorescence spectrometric analysis
- KS M 0017-1995 General rules for X-ray fluorescence spectrometric analysis
- KS D 1655-2019 Method for X-ray fluorescence spectrometric analysis of iron and steel
- KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
- KS M 0043-2009 General rules for X-ray diffractometric analysis
- KS L 3316-1988 Method for X-ray fluorescence spectrometric analysis of refractory products
- KS L 3316-1998 Method for X-ray fluorescence spectrometric analysis of refractory products
- KS D 1686-2011(2021) Method for x-ray fluorescence spectrometric analysis of ferroalloys
- KS L 3316-2014(2019) Method for X-ray fluorescence spectrometric analysis of refractory products
- KS L 3316-2014 Method for X-ray fluorescence spectrometric analysis of refractory products
- KS L 3316-2019 Method for X-ray fluorescence spectrometric analysis of refractory products
- KS D 1686-2021 Method for x-ray fluorescence spectrometric analysis of ferroalloys
- KS M 0017-2010 General rules for X-ray fluorescence spectrometric analysis
- KS D ISO 15470-2020 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
- KS E 3076-2017 Methods for X－ray fluorescence spectrometric analysis of silica stone and silica sand
- KS E 3076-2022 Methods for X-ray fluorescence spectrometric analysis of silica stone and silica sand
- KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
- KS D ISO 15472-2003(2018) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
- KS L 3316-2009 Method for X-ray fluorescence spectrometric analysis of refractory brikcs and refractory mortars
- KS D 2597-1996(2021) Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys
- KS D ISO 19318-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
- KS D 2597-2021 Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys
- KS D 1898-1993 Method for fluorescent X-ray analysis of copper alloys
- KS E 3075-2017 Method for X－ray fluorescence spectrometric analysis of limestone and dolomite
- KS E 3075-2022 Method for X-ray fluorescence spectrometric analysis of limestone and dolomite
- KS E 3075-2002 Method for X－ray fluorescence spectrometric analysis of limestone and dolomite
- KS D ISO 19318-2020 Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
- KS D 1655-2008(2019) Method for X-ray fluorescence spectrometric analysis of iron and steel
- KS L 5222-2009 Chemical analysis method of cement by x-ray fluorescence
- KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS E 3045-2002(2007) X-ray fluorescence spectrometric analysis for iron ores
- KS L 5222-2019 Chemical analysis method of cement by x-ray fluorescence
- KS D 1686-2011(2016) Method for x-ray fluorescence spectrometric analysis of ferroalloys
- KS D 1655-2008 Method for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 1898-2009 Methods for X-ray fluorescence spectrometric analysis of copper alloys
- KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
- KS D 2597-1996(2016) Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys
RU-GOST R, x-ray photoelectron spectroscopy and x-ray x
- GOST R 55080-2012 Cast iron. Method of X-ray fluorescence (XRF) analysis
- GOST 28033-1989 Steel. Method of X-ray-fluorescent analysis
- GOST 16865-1979 X-ray apparatus for structural and spectral analyses. Terms and definitions
- GOST 22091.4-1986 X-ray devices. The methods of measuring of the voltage of X-ray tube
- GOST 22091.5-1986 X-ray devices. The methods of measuring X-ray tube current
- GOST 22091.14-1986 X-ray devices. The method of measuring the energy flow density (photon flux density) of X-radiation
- GOST 22091.2-1984 X-ray devices. The methods of measuring of the current and the voltage of injection of X-ray betatrons
- GOST R 55410-2013 Refractory. Analysis by X-ray fluorescence (XRF)
- GOST 25645.118-1984 Cosmic X-rays of the discrete sources. Energy spectra and angular coordinates
Professional Standard - Ferrous Metallurgy, x-ray photoelectron spectroscopy and x-ray x
- YB/T 4177-2008 Determination of chemical composition in stag by X-ray fluorescence spectrometry
Professional Standard - Machinery, x-ray photoelectron spectroscopy and x-ray x
PT-IPQ, x-ray photoelectron spectroscopy and x-ray x
中華人民共和國(guó)國(guó)家質(zhì)量監(jiān)督檢驗(yàn)檢疫總局、中國(guó)國(guó)家標(biāo)準(zhǔn)化管理委員會(huì), x-ray photoelectron spectroscopy and x-ray x
- GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
- GB/T 33502-2017 Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS）
Standard Association of Australia （SAA）, x-ray photoelectron spectroscopy and x-ray x
- AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- AS ISO 19318:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
國(guó)家市場(chǎng)監(jiān)督管理總局、中國(guó)國(guó)家標(biāo)準(zhǔn)化管理委員會(huì), x-ray photoelectron spectroscopy and x-ray x
- GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
- GB/T 41073-2021 Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- GB/T 16597-2019 Analytical methods of metallurgical products—General rule for X-ray fluorescence spectrometric methods
VDI - Verein Deutscher Ingenieure, x-ray photoelectron spectroscopy and x-ray x
Professional Standard - Agriculture, x-ray photoelectron spectroscopy and x-ray x
SE-SIS, x-ray photoelectron spectroscopy and x-ray x
- SIS SS IEC 573:1986 X-ray equipment - Measurement of the conversion factor of electro-opticalX-ray image intensifiers
- SIS SS IEC 520:1989 X-ray equipment — Entrance fieldsizes of electrooptical X-ray image intensifiers
- SIS SS IEC 627:1986 X-ray equipment - Characteristics of anti-scatter grids used in X-ray equipment
- SIS SS IEC 572:1986 X-ray equipment - Determination ofthe luminance distribution of electro-optical X-ray image intensifiers
- SIS SS IEC 858:1987 X-ray equipment - Determination of the image distortion of electro-optical X-ray image intensifiers
- SIS SS IEC 406:1989 X-ray equipment — Radiographic cassettes
- SIS SS IEC 658:1986 X-ray equipment - Radiographic intensifying screens for medical use - Dimensions
- SIS SS IEC 637:1986 X-ray equipment - Marking of and accompanying documents for X-ray tu bes and X-ray tube assemblies for medical use
Guangdong Provincial Standard of the People's Republic of China, x-ray photoelectron spectroscopy and x-ray x
- DB44/T 1602-2015 Analysis Method of Stone Composition--X-ray Fluorescence Spectrometry
Group Standards of the People's Republic of China, x-ray photoelectron spectroscopy and x-ray x
- T/CSTM 01199-2024 Multilayer metal film-Measurement and analysis method of layer structure-X-ray photoelectron spectroscopy
Professional Standard - Building Materials, x-ray photoelectron spectroscopy and x-ray x
工業(yè)和信息化部/國(guó)家能源局, x-ray photoelectron spectroscopy and x-ray x
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
- JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer
American National Standards Institute （ANSI), x-ray photoelectron spectroscopy and x-ray x
- ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
Professional Standard - Electron, x-ray photoelectron spectroscopy and x-ray x
- SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
- SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers
- SJ/Z 733-1973 Preferred series and types of X-ray tubes
Institute of Electrical and Electronics Engineers (IEEE), x-ray photoelectron spectroscopy and x-ray x
- IEEE 759-1984 Test procedures for semiconductor X-ray energy spectrometers
IN-BIS, x-ray photoelectron spectroscopy and x-ray x
- IS 12803-1989 Method for analyzing hydraulic cement using X-ray fluorescence spectrometer
Fujian Provincial Standard of the People's Republic of China, x-ray photoelectron spectroscopy and x-ray x
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
工業(yè)和信息化部, x-ray photoelectron spectroscopy and x-ray x
International Electrotechnical Commission (IEC), x-ray photoelectron spectroscopy and x-ray x
- IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
Occupational Health Standard of the People's Republic of China, x-ray photoelectron spectroscopy and x-ray x
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
SAE - SAE International, x-ray photoelectron spectroscopy and x-ray x
VDE - VDE Verlag GmbH@ Berlin@ Germany, x-ray photoelectron spectroscopy and x-ray x
- VDE 0412-20-2011 Strahlungsmessgeraete - Tragbare Roentgenfluoreszenz-Analysegeraete mit Kleinstroentgenroehre (IEC 62495:2011)
National Metrological Technical Specifications of the People's Republic of China, x-ray photoelectron spectroscopy and x-ray x
- JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
- JJF 2024-2023 Calibration specifications for energy dispersive X-ray fluorescence spectrometers
Professional Standard - Commodity Inspection, x-ray photoelectron spectroscopy and x-ray x
- SN/T 2079-2008 Method for analysis of stainless and alloy steels.X-ray fluorescence spectrometry
國(guó)家能源局, x-ray photoelectron spectroscopy and x-ray x
- SY/T 7420-2018 X-ray fluorescence spectroscopy element logging specifications
Professional Standard - Judicatory, x-ray photoelectron spectroscopy and x-ray x
- SF/T 0139-2023 Soil inspection scanning electron microscope/X-ray energy spectrometry
Association of German Mechanical Engineers, x-ray photoelectron spectroscopy and x-ray x