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DEElectron Spectroscopy Scanning Electron Microscopy
Electron Spectroscopy Scanning Electron Microscopy, Total:68 items.
In the international standard classification, Electron Spectroscopy Scanning Electron Microscopy involves: Optical equipment, Analytical chemistry, Vocabularies, Education, Protection against crime, Medical sciences and health care facilities in general, Physics. Chemistry, Optics and optical measurements, Testing of metals, Paints and varnishes, Construction materials.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron Spectroscopy Scanning Electron Microscopy
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 17362-2008 Scanning electron microscope X-ray energy spectrum analysis method for gold products
- GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
- GB/T 25189-2010 Microbeam analysis.Determination method for quantitative analysis parameters of SEM-EDS
- GB/T 17361-2013 Microbeam analysis.Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
International Organization for Standardization (ISO), Electron Spectroscopy Scanning Electron Microscopy
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
中華人民共和國國家質(zhì)量監(jiān)督檢驗(yàn)檢疫總局、中國國家標(biāo)準(zhǔn)化管理委員會, Electron Spectroscopy Scanning Electron Microscopy
- GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
Fujian Provincial Standard of the People's Republic of China, Electron Spectroscopy Scanning Electron Microscopy
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
國家市場監(jiān)督管理總局、中國國家標(biāo)準(zhǔn)化管理委員會, Electron Spectroscopy Scanning Electron Microscopy
- GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
SCC, Electron Spectroscopy Scanning Electron Microscopy
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
- DANSK DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
GSO, Electron Spectroscopy Scanning Electron Microscopy
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
- OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
KR-KS, Electron Spectroscopy Scanning Electron Microscopy
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
Korean Agency for Technology and Standards (KATS), Electron Spectroscopy Scanning Electron Microscopy
Professional Standard - Education, Electron Spectroscopy Scanning Electron Microscopy
- JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
- JY/T 010-1996 General principles of analytical scanning electron microscopy
Professional Standard - Judicatory, Electron Spectroscopy Scanning Electron Microscopy
- SF/T 0139-2023 Soil inspection scanning electron microscope/X-ray energy spectrometry
Professional Standard - Petroleum, Electron Spectroscopy Scanning Electron Microscopy
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
- SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
國家能源局, Electron Spectroscopy Scanning Electron Microscopy
- SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples
British Standards Institution (BSI), Electron Spectroscopy Scanning Electron Microscopy
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
- BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
Association Francaise de Normalisation, Electron Spectroscopy Scanning Electron Microscopy
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
Professional Standard - Public Safety Standards, Electron Spectroscopy Scanning Electron Microscopy
- GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
- GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
American Society for Testing and Materials (ASTM), Electron Spectroscopy Scanning Electron Microscopy
- ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
- ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
- ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
Japanese Industrial Standards Committee (JISC), Electron Spectroscopy Scanning Electron Microscopy
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
National Metrological Technical Specifications of the People's Republic of China, Electron Spectroscopy Scanning Electron Microscopy
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Machinery, Electron Spectroscopy Scanning Electron Microscopy
National Metrological Verification Regulations of the People's Republic of China, Electron Spectroscopy Scanning Electron Microscopy
Group Standards of the People's Republic of China, Electron Spectroscopy Scanning Electron Microscopy
- T/CSTM 00346-2021 Automatic classification and statistics for the Inclusions in Steel —Energy dispersive spectrum method of scanning electron microscope
- T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method