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Infrared test method, Total:25 items.
In the international standard classification, Infrared test method involves: Semiconducting materials, Burners. Boilers, Glass, Testing of metals, Optoelectronics. Laser equipment.
Military Standard of the People's Republic of China-General Armament Department, Infrared test method
Professional Standard - Electron, Infrared test method
- SJ 2758-1987 Method of measurement by infrared interference for thickness of homoepitaxial layers
- SJ 3247-1989 Methods of measurement for extended-layer thickness of same-type Gallium arsenide by infra-red interference
- SJ 3249.3-1989 Methods of measurement for chromium concentration in semi-insulation Gallium arsenide by infra-red absorption
- SJ 3249.2-1989 Methods of measurement for Carbon concentration of semi-insulation Gallicem arsenide single crystal by infra-red absorption
- SJ 2757-1987 Method of measurement by infra-red reflection for charge carrier concentraiton of heavily doped semiconductors
- SJ 3248-1989 Methods for measuring carrier concentration of readded Gallium arsenide and Indium phosphide by infra-red reflection
- SJ 2658.3-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for backward voltage
- SJ 2658.4-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for capacitance
- SJ 2658.7-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for radiant flux
- SJ 2658.2-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for forward voltage drop
- SJ 2658.10-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for modulated wideband
- SJ 2658.8-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for normal radiance
- SJ 2658.5-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for forward series resistance
- SJ 2658.6-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for output optical power
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Infrared test method
- GB/T 19199-2003 Test method for carbon concentration of semi-insulating monocrystal gallium arsenide by measurement infrared absorption method
- GB/T 7962.17-1987 Colourless optical glass test methods--Least deviation angular test method for refractive index in the ultraviolet and infrared wave band
- GB/T 17170-2015 Test method for the EL2 deep donor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy
- GB/T 19199-2015 Test methods for carbon acceptor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy
- GB/T 17170-1997 Test method for deep level EL2 concentration of undoped semi-insulating monocrystal gallium arsenide by measurement infrared absorption method
Fujian Provincial Standard of the People's Republic of China, Infrared test method
- DB35/T 1472-2014 Infrared Thermography Test Method for Surface Heat Loss of Industrial Boilers
國(guó)家市場(chǎng)監(jiān)督管理總局、中國(guó)國(guó)家標(biāo)準(zhǔn)化管理委員會(huì), Infrared test method
- GB/T 36403-2018 Test methods of infrared transmittance for infrared optical glass—Fourier transform method
Group Standards of the People's Republic of China, Infrared test method
Professional Standard - Aerospace, Infrared test method