GB/T 43063-2023 集成電路 CMOS圖像傳感器測試方法

Integrated circuit CMOS image sensor testing method

GB/T 18904.5-2003 半導(dǎo)體器件 第12-5部分;光電子器件 纖維光學(xué)系統(tǒng)或子系統(tǒng)用帶/不帶尾纖的pin光電二極管空白詳細規(guī)范

本空白詳細規(guī)范是半導(dǎo)體器件的一系列空白詳細規(guī)范之一，并應(yīng)與下列IEC標(biāo)準一起使用。IEC 60747—10(Qc 700000)：1991 半導(dǎo)體器件 第l0部分分立器件和集成電路總規(guī)范IEC 60747—12(QC 720100)：1985半導(dǎo)體器件第l2部分光電子器件分規(guī)范

Semiconductor devices Part 12-5: Optoelectronic devices Blank detail specification for pin-photodiodeswith/without pigtail for fibre optic systems or subsystems

GB/T 18904.3-2002 半導(dǎo)體器件 第12-3部分;光電子器件 顯示用發(fā)光二極管空白詳細規(guī)范

本空白詳細規(guī)范是半導(dǎo)體器件的一系列空白詳細規(guī)范之一。

Semiconductor devices--Part 12-3: Optoelectronic devices--Blank detail specification for light-emitting diodes--Display application

GB/T 18904.4-2002 半導(dǎo)體器件 第12-4部分;光電子器件 纖維光學(xué)系統(tǒng)或子系統(tǒng)用帶/不帶尾纖的pin-FET模塊空白詳細規(guī)范

本空白詳細規(guī)范是半導(dǎo)體器件的一系列空白詳細規(guī)范之一。

Semiconductor devices-Part 12-4: Optoelectronic devices-Blank detail specification for pin-FET modules with/without pigtail for fiber optic systems or sub-systems

IEC 60747-5-6:2021 半導(dǎo)體設(shè)備. 第5-6部分: 光電設(shè)備. 發(fā)光二極管

This part of IEC 60747 specifies the terminology, the essential ratings and characteristics, the measuring methods and the quality evaluations of light emitting diodes (LEDs) for general industrial applications such as signals, controllers, sensors, etc. LEDs for lighting applica

Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

NF C57-201*NF EN 50380:2017 光電模塊的標(biāo)記和文件要求

Marking and documentation requirements for photovoltaic modules

IEC 60747-5-6:2016 半導(dǎo)體設(shè)備. 第5-6部分: 光電設(shè)備. 發(fā)光二極管

This part of IEC 60747 specifies the terminology, the essential ratings and characteristics, the measuring methods and the quality evaluations of light emitting diodes (LEDs) for general industrial applications such as signals, controllers, sensors, etc. LEDs for lighting applications are out of the scope of this part of IEC 60747. The types of LED are divided into the following five classes: a) LED package; b) LED flat illuminator; c) LED numeric display and alpha-numeric display; d) LED dot-matrix display; e) I LED (infrared-emitting diode). LEDs with a heat spreader or having a terminal geometry that performs the function of a heat spreader are within the scope of this part of IEC 60747. An integration of LEDs and controlgears, integrated LED modules, semi-integrated LED modules, integrated LED lamps or semi-integrated LED lamps, are out of the scope of this part of IEC 60747.

Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

IEC 60747-5-7:2016 半導(dǎo)體設(shè)備. 第5-7部分: 光電設(shè)備. 光電二極管和光電晶體管

This part of IEC 60747 specifies the terminology, the essential ratings and characteristics as well as the measuring methods of photodiodes (hereinafter referred to as "PDs") and phototransistors (hereinafter referred to as "PTs").

Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors

SJ/T 2354-2015/0352 PIN、雪崩光電二極管測試方法

本標(biāo)準規(guī)定了PIN、雪崩光電二極管(以下簡稱“二極管”)光電參數(shù)的測試方法。

Measuring methods for photodiodes of PIN、APD

SJ/T 2216-2015 硅光電二極管技術(shù)規(guī)范

本規(guī)范規(guī)定了硅光電二極管的光電特性和機械特性以及環(huán)境特性的技術(shù)要求、檢驗方法和檢驗規(guī)則等。本規(guī)范適用于2CU系列硅光電二極管(以下簡稱“器件”)。

Technical specification for photodiode of silicon

SJ/T 2214-2015 半導(dǎo)體光電二極管和光電晶體管測試方法

本標(biāo)準規(guī)定了半導(dǎo)體光電二極管和光電晶體管(以下簡稱“器件”)光電參數(shù)的測試方法。本標(biāo)準適用于半導(dǎo)體光電二極管和光電晶體管光電參數(shù)的測試。本標(biāo)準不適用PIN、雪崩光電二極管的測試。

Measuring methods for semiconductor photodiode and phototransistor

SJ/T 2354-2015 PIN、雪崩光電二極管測試方法

本標(biāo)準規(guī)定了PIN、雪崩光電二極管(以下簡稱“二極管”)光電參數(shù)的測試方法。

Measuring methods for photodiodes of PIN、APD

SJ/T 2217-2014 硅光電晶體管技術(shù)規(guī)范

本規(guī)范規(guī)定了硅光電晶體管(以下簡稱“器件”)光電特性、機械特性和環(huán)境性能的技術(shù)要求、檢驗方法和檢驗規(guī)則。本規(guī)范適用于3DU系列硅光電晶體管。

Technical specification for phototransistor of silicon

IEC 61730-2:2012 光電(PV)模件安全合格鑒定.第2部分:檢驗要求

Photovoltaic (PV) module safety qualification - Part 2: Requirements for testing

JB/T 9479-2011 光敏電阻器總規(guī)范

本標(biāo)準規(guī)定了光敏電阻器的術(shù)語和定義、分類與型號命名、要求、試驗方法、檢驗規(guī)則、標(biāo)志、包裝、貯存和運輸。 本標(biāo)準適用于波長范圍為380nm～3200nm的光敏電阻器。

Genenral specifications for photoresistors

KS C IEC 61730-1:2008 光電(PV)模件安全合格鑒定.第1部分:施工要求

? ???? ?????(photovoltaic:PV) ??? ?? ?? ?? ??? ? ?

Photovoltaic(PV) module safety qualification-Part 1:Requirements for construction

KS C IEC 62124:2008 光電獨立系統(tǒng).設(shè)計檢定

? ??? ??? ??, ???? ? ??? ??? ????? ???? ???? ???.

Photovoltaic(PV) stand-alone systems－Design verification

KS C IEC 61730-2:2008 光電(PV)模件安全合格鑒定.第2部分:檢驗要求

? ??? ?????(photovoltaic:PV) ??? ?? ?? ?? ?? ?? ?

Photovoltaic(PV) module safety qualification-Part 2:Requirements for testing

ASTM E1036-08 使用標(biāo)準電池的排列和非聚能地面光電模電氣性能的標(biāo)準試驗方法

It is the intent of these procedures to provide recognized methods for testing and reporting the electrical performance of photovoltaic modules and arrays. The test results may be used for comparison of different modules or arrays among a group of similar items that might be encountered in testing a group of modules or arrays from a single source. They also may be used to compare diverse designs, such as products from different manufacturers. Repeated measurements of the same module or array may be used for the study of changes in device performance. Measurements may be made over a range of test conditions. The measurement data are numerically translated from the test conditions to standard RC, to nominal operating conditions, or to optional user-specified reporting conditions. Recommended RC are defined in Table 1. If the test conditions are such that the device temperature is within ±2°C of the RC temperature and the total irradiance is within ±5 % of the RC irradiance, the numerical translation consists of a correction to the measured device current based on the total irradiance during the I-V measurement. If the provision in 5.3.1 is not met, performance at RC is obtained from four separate I-V measurements at temperature and irradiance conditions that bracket the desired RC using a bilinear interpolation method. There are a variety of methods that may be used to bracket the temperature and irradiance. One method involves cooling the module under test below the reference temperature and making repeated measurements of the I-V characteristics as the module warms up. The irradiance of pulsed light sources may be adjusted by using neutral density mesh filters of varying transmittance. If the distance between the simulator and the test plane can be varied then this adjustment can be used to change the irradiance. In natural sunlight, the irradiance will change with the time of day or if the solar incidence angle is adjusted. These test methods are based on two requirements. First, the reference cell (or module, see 1.1.1 and 4.3.4) is selected so that its spectral response is considered to be close to the module or array to be tested. Second, the spectral response of a representative cell and the spectral distribution of the irradiance source must be known. The calibration constant of the reference cell is then corrected to account for the difference between the actual and the reference spectral irradiance distributions using the spectral mismatch parameter, which is defined in Test Method E 973. Terrestrial reference cells are calibrated with respect to a reference spectral irradiance distribution, for example, Tables G 173. A reference cell made and calibrated as described in 4.3 will indicate the total irradiance incident on a module or array whose spectral response is close to that of the reference cell. With the performance data determined in accordance with these test methods, it becomes possible to predict module or array performance from measurements under any test light source in terms of any reference spectral irradiance distribution. The reference conditions of 5.3.1 must be met if the measured I-V curve exhibits “kinks” or multiple inflection points. TABLE 1 Reporting Conditions Total Irradiance, Wm............

Standard Test Methods for Electrical Performance of Nonconcentrator Terrestrial Photovoltaic Modules and Arrays Using Reference Cells

KS C IEC 62093:2007 光電系統(tǒng)的系統(tǒng)平衡元部件.設(shè)計鑒定自然環(huán)境

? ??? ??? ??? ?????(PV)???? ???? ???? ??? ????? ??

Balance-of-system components for photovoltaic systems－Design qualification natural environments